Bruker Nano Metrology

Dektak Stylus Profilers - Over 10,000 units sold!

New Contour Optical Profilers

If you need to measure step heights, roughness, stress, or waviness, whether on a flat surface or a non-flat surface, Bruker Nano Metrology is your best choice. 

IES is your Bruker Nano Metrology Dektak and Contour representative for New England and New York. Please call or email us for all your thin film and surface measurement needs. We will provide fast response on any requirement including quotations, product specifications, and product recommendations.

Video below is a general presentation (< 3 minutes) on the history
of the Dektak up to the new Dektak XT: 

Video below (< 7 minutes) provides a detailed operational 
overview of the Dektak XT: 



Click here for more information on the Dektak XT